Complex s-Plane Modeling and 2D Characterization of the Stochastic Scattering Loss in Symmetric Dielectric Slab Waveguides Exhibiting Ergodic Surface-Roughness With an Exponential Autocorrelation Function

Journal article

Peer reviewed

IEEE Access, Vol.9, pp.92326-92344

2021

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https://doi.org/10.1109/ACCESS.2021.3092635View

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Title: Complex s-Plane Modeling and 2D Characterization of the Stochastic Scattering Loss in Symmetric Dielectric Slab Waveguides Exhibiting Ergodic Surface-Roughness With an Exponential Autocorrelation Function
Creators: Ata Zadehgol - University of Idaho
Publication Details: IEEE Access, Vol.9, pp.92326-92344
Identifiers: 996632196101851
Academic Unit: Electrical and Computer Engineering; Center for Secure and Dependable Systems
Language: English
Resource Type: Journal article