Characterizing THz Scattering Loss in Nano-Scale SOI Waveguides Exhibiting Stochastic Surface Roughness with Exponential Autocorrelation

Journal article

Peer reviewed

Ata Zadehgol and Brian Guiana

Electronics, Vol.11(3)

2022

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Title: Characterizing THz Scattering Loss in Nano-Scale SOI Waveguides Exhibiting Stochastic Surface Roughness with Exponential Autocorrelation
Creators: Ata Zadehgol - University of Idaho
Brian Guiana - University of Idaho
Publication Details: Electronics, Vol.11(3)
Identifiers: 996632347501851
Academic Unit: Electrical and Computer Engineering; Center for Secure and Dependable Systems
Language: English
Resource Type: Journal article