Yield Testing of Early Generation Populations of Common Bean

Journal article

Peer reviewed

Shree P Singh, Rogelio Lépiz, J Ariel Gutiérrez, Carlos A Urrea, Albeiro Molina and Henry Teran

Crop Science, Vol.30(4), p.874

1990

Files and links (1)

url

https://doi.org/10.2135/cropsci1990.0011183X003000040022xView

1 Record Views

Title: Yield Testing of Early Generation Populations of Common Bean
Creators: Shree P Singh - International Center for Tropical Agriculture
Rogelio Lépiz - International Center for Tropical Agriculture
J Ariel Gutiérrez
Carlos A Urrea - International Center for Tropical Agriculture
Albeiro Molina - International Center for Tropical Agriculture
Henry Teran - International Center for Tropical Agriculture
Publication Details: Crop Science, Vol.30(4), p.874
Identifiers: 996632234401851
Academic Unit: Kimberly Research and Extension Center
Language: English
Resource Type: Journal article