X-ray photoelectron spectroscopy analysis for the chemical impact of solvent addition rate on electromagnetic shielding effectiveness of HCl-doped polyaniline nanopowders

Journal article

Peer reviewed

D Eric Aston, Deukhyoun Heo, Blaise-Alexis Fouetio Kengne, David N McIlroy, Tai Nguyen, You Qiang and Hesham Ramzy Tantawy

Journal of Applied Physics, Vol.118(17)

2015

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Title: X-ray photoelectron spectroscopy analysis for the chemical impact of solvent addition rate on electromagnetic shielding effectiveness of HCl-doped polyaniline nanopowders
Creators: D Eric Aston - University of Idaho
Deukhyoun Heo - Washington State University Spokane
Blaise-Alexis Fouetio Kengne
David N McIlroy - University of Idaho
Tai Nguyen - Washington State University Spokane
You Qiang - University of Idaho
Hesham Ramzy Tantawy - University of Idaho
Publication Details: Journal of Applied Physics, Vol.118(17)
Identifiers: 996632046001851
Academic Unit: Chemical and Biological Engineering; Physics
Language: English
Resource Type: Journal article