Simultaneous diffuse reflection infrared spectroscopy and X-ray pair distribution function measurements

Journal article

Peer reviewed

Kevin A Beyer, Olaf Borkiewicz, Karena W Chapman, Peter J Chupas, Mark A Newton and Haiyan Zhao

Journal of Applied Crystallography, Vol.47, pp.1118-11311

2014

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Title: Simultaneous diffuse reflection infrared spectroscopy and X-ray pair distribution function measurements
Creators: Kevin A Beyer
Olaf Borkiewicz
Karena W Chapman
Peter J Chupas
Mark A Newton
Haiyan Zhao
Publication Details: Journal of Applied Crystallography, Vol.47, pp.1118-11311
Identifiers: 996630792101851
Academic Unit: Chemical and Biological Engineering
Language: English
Resource Type: Journal article