Reliability modeling and analysis of IEC 61850 based substation protection systems

Journal article

Peer reviewed

Hangtian Lei, Chanan Singh and Alex Sprintson

IEEE Transactions on Smart Grid, Vol.5(5), pp.2194-2202

2014

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http://dx.doi.org/10.1109/TSG.2014.2314616View

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Title: Reliability modeling and analysis of IEC 61850 based substation protection systems
Creators: Hangtian Lei - Texas A&M University
Chanan Singh - Texas A&M University
Alex Sprintson - Texas A&M University
Publication Details: IEEE Transactions on Smart Grid, Vol.5(5), pp.2194-2202
Identifiers: 996632065401851
Academic Unit: Electrical and Computer Engineering
Language: English
Resource Type: Journal article