Abstract
A double-interface CoFeB/MgO magnetic tunnel junction (MTJ) has a high thermal stability barrier (E) and high-efficiency magnetization switching with the scaling of device dimensions. However, compared to a single-interface CoFeB/MgO MTJ, its more complicated film stacks and interfaces are more vulnerable to irradiation-induced swift heavy ions. We have studied the irradiation effects of Ta/Kr ions on double-interface CoFeB/MgO MTJs. Structural and physical analyses are performed through transmission electron microscopy, energy dispersive x-ray spectroscopy, and vibrating sample magnetometry. 1907MeV Ta-ion irradiation damages the interfaces of the double-interface MTJ, resulting in the irreversible decrease in coercivity, while 2060MeV Kr-ion irradiation damages the bulk properties of the MTJ, leading to the decrease in saturation magnetization. However, the electronic properties of the double-interface MTJ are almost immune to Kr-ion irradiation.