Novel Application of a Gaussian Model of the Band-Edge in the Study of Defect Dynamics in ZnO Thin Film

Journal article

A Canul, D Thapa, J Lapp, J Huso and L Bergman

Bulletin of the American Physical Society 65

01/01/2019

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Title: Novel Application of a Gaussian Model of the Band-Edge in the Study of Defect Dynamics in ZnO Thin Film
Creators: A Canul
D Thapa
J Lapp
J Huso
L Bergman
Publication Details: Bulletin of the American Physical Society 65
Conference: Bulletin of the American Physical Society 65
Identifiers: 997018660501851
Academic Unit: Physics
Language: English
Resource Type: Journal article