Measuring the complexity of class diagrams in reverse engineering

Journal article

Peer reviewed

Journal of Software Maintenance and Evolution-research and Practice, Vol.18(5), pp.333-350

2006

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Title: Measuring the complexity of class diagrams in reverse engineering
Creators: Frederick T Sheldon - Oak Ridge National Laboratory
Hong Chung - Keimyung University
Publication Details: Journal of Software Maintenance and Evolution-research and Practice, Vol.18(5), pp.333-350
Identifiers: 996630767801851
Academic Unit: Computer Science
Language: English
Resource Type: Journal article