Genetic characterization and genome-wide association mapping for dwarf bunt resistance in bread wheat accessions from the USDA National Small Grains Collection.

Journal article

Peer reviewed

Tyler Gordon, Rui Wang, David Hole, Harold Bockelman, J Michael Bonman and Jianli Chen

Theoretical and Applied Genetics, Vol.133(3), pp.1069-1080

2020

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https://doi.org/10.1007/s00122-020-03532-0View

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Title: Genetic characterization and genome-wide association mapping for dwarf bunt resistance in bread wheat accessions from the USDA National Small Grains Collection.
Creators: Tyler Gordon - University of Idaho
Rui Wang - University of Idaho
David Hole - Utah State University
Harold Bockelman
J Michael Bonman
Jianli Chen - University of Idaho
Publication Details: Theoretical and Applied Genetics, Vol.133(3), pp.1069-1080
Identifiers: 996630759901851
Academic Unit: Plant Sciences
Language: English
Resource Type: Journal article