Examining Coincident Failures and Usage Profiles in Reliability Analysis of an Embedded Vehicle Sub-System.

Journal article

FT Sheldon, K Jerath and S Greiner

ESM, pp.558-563

01/01/2002

Metrics

1 Record Views

Title: Examining Coincident Failures and Usage Profiles in Reliability Analysis of an Embedded Vehicle Sub-System.
Creators: FT Sheldon
K Jerath
S Greiner
Publication Details: ESM, pp.558-563
Identifiers: 997015819301851
Academic Unit: Computer Science
Language: English
Resource Type: Journal article