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Electron beam-induced thickening of the protective oxide layer around Fe nanoparticles
Journal article   Peer reviewed

Electron beam-induced thickening of the protective oxide layer around Fe nanoparticles

You Qiang, Chongmin Wang, Donald R Baer, James E Amonette, Mark Engelhard and Jiji Antony
Ultramicroscopy, Vol.108(1), pp.43-51
2007
url
http://dx.doi.org/10.1016/j.ultramic.2007.03.002View

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