Behavior of a radiation-immune CMOS logic family under resistive shorts

Journal article

Peer reviewed

James Frenzel and Erik H Ingermann

IEEE Transactions on Reliability, Vol.45(2), pp.194-199

1996

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http://ws.isiknowledge.com/cps/openurl/service?url_ver=Z39.88-2004&rft_id=info:ut/A1996UX98500009View

Title: Behavior of a radiation-immune CMOS logic family under resistive shorts
Creators: James Frenzel
Erik H Ingermann - Intel
Publication Details: IEEE Transactions on Reliability, Vol.45(2), pp.194-199
Identifiers: 996631805201851
Academic Unit: Center for Traffic Operations and Control; Electrical and Computer Engineering
Language: English
Resource Type: Journal article