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Journal article
3D Stacking of SiC Integrated Circuit Chips with Gold Wire Bonded Interconnects for Long-Duration High-Temperature Applications
Feng Li
2022
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Title
3D Stacking of SiC Integrated Circuit Chips with Gold Wire Bonded Interconnects for Long-Duration High-Temperature Applications
Creators
Feng Li
Identifiers
996629871601851
Academic Unit
Electrical and Computer Engineering
Language
English
Resource Type
Journal article
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