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NIST 800-22 Statistical Validation of SRAM-based PUFs for Hardware Security
Conference paper

NIST 800-22 Statistical Validation of SRAM-based PUFs for Hardware Security

Zain Ul Abideen
Proceedings (IEEE North Atlantic Test Workshop. Online), pp.1-4
IEEE
2025 IEEE 34st Microelectronics Design & Test Symposium (Albany, NY, 05/19/2025–05/21/2025)
05/19/2025

Abstract

Entropy Hamming distances Hardware security Measurement Multiplexing NIST NIST 800-22 Physical unclonable function Robustness Secure-key Generation SRAM-based PUF Stability criteria Statistical Evaluation Cryptography
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