Growth and characterization of bulk crystals, thin films and patterned structures of AlN, GaN and Al xGa 1-xN on SiC (0001) substrates and device-related research

Conference paper

RF Davis, CM Balkas, L Bergman, MD Bremser, OH Nam and WG Perry

1997 Digest of the IEEE/LEOS Summer Topical Meeting: Vertical-Cavity Lasers

01/01/1997

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Title: Growth and characterization of bulk crystals, thin films and patterned structures of AlN, GaN and Al xGa 1-xN on SiC (0001) substrates and device-related research
Creators: RF Davis
CM Balkas
L Bergman
MD Bremser
OH Nam
WG Perry
Conference: 1997 Digest of the IEEE/LEOS Summer Topical Meeting: Vertical-Cavity Lasers
Identifiers: 997018233301851
Academic Unit: Physics
Language: English
Resource Type: Conference paper