Assessing the effect of failure severity, coincident failures and usage-profiles on the reliability of embedded control systems

Conference paper

K Jerath and FT Sheldon

2004 ACM symposium on Applied computing-SAC'04 (01/01/2004)

01/01/2004

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Title: Assessing the effect of failure severity, coincident failures and usage-profiles on the reliability of embedded control systems
Creators: K Jerath
FT Sheldon
Conference: 2004 ACM symposium on Applied computing-SAC'04 (01/01/2004)
Identifiers: 997015818901851
Academic Unit: Computer Science
Language: English
Resource Type: Conference paper